Nanotech 2012 Vol. 2
Nanotech 2012 Vol. 2
Nanotechnology 2012: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational (Volume 2)

Micro & Nano Reliability Chapter 6

Modeling of Dynamic Threshold Voltage of High K Gate Stack and Application in FinFET Reliability
H. He, C. Ma, C. Wang, A. Zhang, J. He
Peking Univeristy, CN

Functional Performance of Microfluidic On-Board Pumps and Valves with Various Actuation Protocols
J. Podczeviensky, J. McDowell, L. Levine
ALine, Inc., US

Shock Testing of Free Standing Silicon-Nitride and Beryllium Membranes
D. Brough, L. Barrett, R. Vanfleet, R. Davis, S. Liddiard, S. Cornaby, M. Coffin
Brigham Young University, US

Nanoscale deformation analysis for fracture mechanical evaluation of interface cracks in electronic packages.
J. Keller, M. Schulz, R. Mrossko, B. Wunderle, B. Michel
AMIC Angwandte Micro-Messtechnik GmbH, DE

Reliability Prediction of Single-Crystal Silicon MEMS Using Dynamic Raman Spectroscopy
R. Dewanto, Z. Hu, B. Gallacher, J. Hedley
Newcastle University, UK

Detecting Defects over the Whole Surface of Wafer by Non-destructive and Non-contact Pulse Photoconductivity Method (PPCM)
J. Ndagijimana, Y. Soh, H. Kubota, K. Kobayashi
Kumamoto University, JP

Experimental analysis of the MEMS Capacitive accelerometer’s shock resistibility
Y. Tao, Y. Liu, J. Dong
Tsinghua University, CN

Impact of Channel Length and Gate Width of a N-MOSFET Device on the Threshold Voltage and its Fluctuations in Presence of Random Channel Dopants and Random Interface Trap: A 3D Ensemble Monte Carlo Stud
N. Ashraf, S. Joshi, D. Vasileska

ISBN: 978-1-4665-6275-2
Pages: 878
Hardcopy: $209.95