Sharma U., Susnitzky D.
Evans Analytical Group, US
Keywords: EDS, EELS, microelectronics, nanoparticles, STEM, TEM
This article reviews applications of analytical transmission electron microscopy (TEM) to characterize nano-structured materials and devices. Several practical examples are provided that show the diverse imaging and microanalysis mechanisms available in a modern TEM. By leveraging the right imaging technique, TEM can reveal the properties of materials at the nanometer scale. For this study, samples were prepared by standard preparation methods involving FIB milling (FEI Altura 835) or mechanical polishing followed by Ar+ ion milling or by dispersing nanoparticles on carbon support films. TEM characterization was performed on a FEI Tecnai TF-20XT FEGTEM with 30mm2 INCA EDX detector and GATAN ENFINA PEELS system. Application examples in the field of microelectronics, optoelectronics and nanoparticles are included.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics
Published: May 3, 2009
Pages: 393 - 396
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-1782-7