Rouvimov S., Moon B., Moeck P.
Portland State University, US
Keywords: high resolution transmission electron microscopy, nanocrystals, structure fingerprinting
The methods for structure identification and analysis of nanocrystalline particles are in high demand for nanotechnology and nanofabrication, areas that require fast, reliable and robust metrologies for nanometer-sized objects. High-resolution (HR) transmission electron microscopy (TEM) is of special interest for the development of novel metrologies due to its high spatial resolution (down to 0.05 nm in aberration corrected microscopes), the automation capabilities of modern computer-controlled equipment and fast computing capabilities which allow the processing of a significant amount of information in a short time. The idea of structural fingerprinting based on HRTEM images of nanocrystals is well suited for fast structural identification and allows a further automation of data processing. It employs the major principles of classical electron crystallography and open-access databases of crystal structures [1]. The paper addresses the perspectives of a novel strategy for the HRTEM-based structural fingerprinting of nanocrystals [2]. [1] http://nanocrystallography.research.pdx.edu/CIF-searchable; http://cod.ibt.lt mirrored at both http://www.crystallography.net and http://nanocrystallography.org [2] P. Moeck and P. Fraundorf, Zeitschrift für Kristallographie 222 (2007) 634-645; open access at the web pages of the journal; expanded version at arXiv:0706.202
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics
Published: May 3, 2009
Pages: 323 - 326
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-1782-7