Ptak A., Makowski M., Niemier M., Cichomski M., Gojzewski H., Czajka R.
Poznan University of Technology, PL
Keywords: adhesion, adhesive bonds, force spectroscopy, interaction potential
Using a modified atomic force microscope the nanoadhesion between a silicon tip and a monolayer of 1H, 1H, 2H, 2H-perfluorodecyl-trichlorosilane was measured at different loading rates. Adhesion force-versus-loading rate curves could be fitted with two logarithmic terms, indicating a two-energy-barrier interaction potential.The application of the Bell-Evans model to the analysis of the curves allowed extracting quantitative information about the effective adhesion potential and characterizing the different components contributing to the nanoadhesion. Although van der Waals interactions appear only major contribution to the nanoadhesion, the interaction potential characterizing the nanoadhesion has still a complex, two-barrier character.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics
Published: May 3, 2009
Pages: 281 - 284
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-1782-7