Authors: I. Mats
Affilation: Diatex, Selected Texno-Fix, Canada
Pages: 485 - 488
Keywords: bipolar transistors, current leakage, design, FETs, punchthrough, shape, space charge, space charge limited conduction
The Volt-Ampere Characteristics (VAC)s of P+NP+-structures in the schemes with floating base and short-cut p+-n junction (emitter) in punch-through modes were calculated before. It is important to research a behavior for similar structures but with initial reverse-bias (Uer) injecting p+-n -junction. Calculation and experimental characteristics VACs for lateral and vertical devices has good consultation. P+NP+ (N+PN+) – Devices in this mode can be used in variety Field-Effect Transistors including four terminals, DEPFETs, Punchthrough FETs, Bipolar transistors, Protection elements, Electrostatic dischargers, Charge coupled and photo punch-through devices, Reference sources, and Amplifiers.
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