Authors: C.-M. Teodorescu and D. Luca
Affilation: National Institute of Materials Physics, Romania
Pages: 364 - 367
Keywords: photocatalysts, titana, doping, nanostructured films, manetron sputtering, XANES, EXAFS, XPS, XRD, AFM, spectroscopy
Nitrogen-doped titania films were grown by magnetron sputtering. XPS analysis was used to identify the nitrogen content and the oxygen stoichiometry of the samples. XANES evidenced an increase of the Ti 3d charge density. XRD analysis evidenced mainly rutile phases, with traces of anatase. EXAFS spectroscopy identified a further nanostructured phase, which seems to be the main responsible for lowering the bandgap to around 3 eV and for increased photocatalytic efficiency of the films, as evidenced by UV-Vis. spectroscopy. AFM revealed that the films roughness is reduced.
Nanotech Conference Proceedings are now published in the TechConnect Briefs