Authors: R.S. Chakraborty, S. Narasimhan and S. Bhunia
Affilation: Case Western Reserve University, United States
Pages: 134 - 137
Keywords: CNEMS, hybridization, leakage power, robust embedded memory design, bitline leakage
Embedded static random access memory (SRAM) that constitutes an integral part of nanoelectronic systems, experiences two major challenges with aggressive technology scaling: 1) exponential increase in leakage current  and 2) decrease in robustness of read/write/hold operation . We propose, for the first time, integration of carbon nanotube (CNT) based nano electro-mechanical switches (NEMS) with CMOS-based SRAM to achieve significant improvement in: 1) leakage power in standby mode (~19X compared to the best existing technique) and 2) robustness of read/write operation due to bitline leakage reduction (~55X).
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