Authors: J.-P. Piel, A. Darragon and C. Defranoux
Affilation: SOPRA-SA, France
Pages: 698 - 702
Keywords: spectroscopic ellipsometry
Spectroscopic Ellipsometry (SE) is an optical technique, non destructive, to characterize the complex reflectivity of surfaces and layers from the deep UV (190nm) to the mid InfraRed (20µ). SE does not need any reference surface like interferometry nor reference materials or reference beam like in absorption spectroscopy (IRRAS): this is an absolute technique often called first principal technique.
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