Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2

Characterization Tools and Microscopy Chapter 11

Visualizing Nano-Electromechanics by Vector Piezoresponse Force Microscopy

Authors: B.J. Rodriguez, S. Jesse, A.P. Baddorf, S.V. Kalinin, A. Gruverman

Affilation: Oak Ridge National Laboratory, United States

Pages: 667 - 670

Keywords: AFM, PFM, AFAM, piezoelectric force microscopy

This is a detailed examination of the electro-mechanical and elastic coupling that occurs in the scanning probe microscopy of electro-active materials. This research is useful to detecting, imaging and understanding the orientation of nanoscale electromechanical anisotropies in material. This method has been applied to piezo electric and ferro electric thin films as well as biological samples

ISBN: 0-9767985-1-4
Pages: 808
Hardcopy: $109.95