Keywords: boron, conductivity, nanowires, TEM
In this experiment we report on using in-situ STM-TEM system and EELS to characterize the electronic properties of the boron nanowires. We use low loss EELS approach to study the band structure and the dielectric response of these nanostructures. The STM-TEM system is used for a contact measurement of the conductivity of the individual Boron nanowire imaged in Transmission Electron Microscope (TEM). The in-situ EELS analysis has been completed with the structural information provided with HRTEM
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: May 8, 2005
Pages: 659 - 659
Industry sector: Advanced Materials & Manufacturing
Topic: Nanoparticle Synthesis & Applications
ISBN: 0-9767985-1-4