Nanotech 2004 Vol. 3
Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3

Nano Devices and Systems Chapter 4

Defects and Fault Characterization in Quantum Cellular Automata

Authors: M. Baradaran Tahoori, M. Momenzadeh, J. Huang and F. Lombardi

Affilation: Northeastern University, United States

Pages: 190 - 193

Keywords: quantum computing, nano systems and devices, defect characterization

In this paper, a detailed simulation-based characterization of QCA defects and study of their effects at logic-level are presented. Different defect mechanisms for QCA active devices and interconnects are considered and the appropriate fault models at logic-level are investigated. Different implementations of QCA logic devices and interconnects are compared in term of defect tolerance and testability.

ISBN: 0-9728422-9-2
Pages: 561
Hardcopy: $79.95