Authors: M. Baradaran Tahoori, M. Momenzadeh, J. Huang and F. Lombardi
Affilation: Northeastern University, United States
Pages: 190 - 193
Keywords: quantum computing, nano systems and devices, defect characterization
In this paper, a detailed simulation-based characterization of QCA defects and study of their effects at logic-level are presented. Different defect mechanisms for QCA active devices and interconnects are considered and the appropriate fault models at logic-level are investigated. Different implementations of QCA logic devices and interconnects are compared in term of defect tolerance and testability.
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