Authors: C. McAndrew and P.G. Drennan
Affilation: Motorola, United States
Pages: 715 - 718
Keywords: statistical modeling, SPICE modeling, circuit simulation
Accurate statistical simulation and modeling are important for IC design. Different types of statistical simulation require different types of statistical models. In this paper a unified approach to statistical modeling and characterization is presented. Based on physical process parameters and propagation of variance, it allows modeling of process extremes, distributional modeling for Monte Carlo type simulation, and modeling of mismatch.
Nanotech Conference Proceedings are now published in the TechConnect Briefs