Authors: Y. Subramanian and R.B. Darling
Affilation: University of Washington, United States
Pages: 48 - 51
Keywords: avalanche, breakdown, pn junction, ESD, CAD
This paper presents and validates compact, physically-based electrothermal models of the avalanche process in pn junctions for use in network simulators (e.g. Saber). Self-heating effects are also included. This enables the simulation of large systems of interconnected ESD structures, permitting a 'CAD-for-ESD' approach in commercial ESD design.
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