Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 1
Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems

Compact Modeling and Model Order Reduction Chapter 3

Compact Modeling of Avalanche Breakdown in pn-Junctions for Computer-Aided ESD Design (CAD for ESD)

Authors: Y. Subramanian and R.B. Darling

Affilation: University of Washington, United States

Pages: 48 - 51

Keywords: avalanche, breakdown, pn junction, ESD, CAD

This paper presents and validates compact, physically-based electrothermal models of the avalanche process in pn junctions for use in network simulators (e.g. Saber). Self-heating effects are also included. This enables the simulation of large systems of interconnected ESD structures, permitting a 'CAD-for-ESD' approach in commercial ESD design.

ISBN: 0-9708275-0-4
Pages: 638