MSM 2000
MSM 2000
Technical Proceedings of the 2000 International Conference on Modeling and Simulation of Microsystems

Numerics, Algorithms Chapter 11

The Atomic Limit of Finite Elements in the Simulation of Micro-Resonators
R.E. Rudd
University of Oxford, UK

3D Simulations of Ultra-Small MOSFETs: The Role of the Short Range Coulomb Interactions and Discrete Impurities on Device Terminal Characteristics
W.J. Gross, D. Vasileska and D.K. Ferry
Intel Corporation, US

Robust Algorithms for Boundary-Element Integrals on Curved Surfaces
X. Wang, J.N. Newman and J.K. White
Massachusetts Institute of Technology, US

A Quadratic Method for Nonlinear Model Order Reduction
Y. Chen and J.K. White
Massachusetts Institute of Technology, US

A Novel Approach for Determining Pull-In Voltages in Micro-electro-mechanical Systems (MEMS)
D.S. Long, M.A. Shannon and N.R. Aluru
University of Illinois at Urbana-Champaign, US

Nonlinear Analysis of Electrostatic Actuation in MEMS with Arbitrary Geometry
S. Taschini, H. Baltes and J.G. Korvink
ETH-Hoenggerberg, CH

Mathematical Analysis of Electrostatically Actuated MEMS Devices
D. Bernstein, P. Guidotti and J.A. Pelesko
California Institute of Technology, US

Reduced-Order Models of Stress-Stiffened MEMS Structures
M. Varghese, V.L. Rabinovich and S.D. Senturia
Massachusetts Institute of Technology, US

Co-simulation and Optimization Micro Electro Mechanical Systems by Using Method of Theoretical Investigation
V. Mkrttchian
State Engineering University of Armenia, AM

Finite Element Based Electrostatic-Structural Coupled Analysis with Automated Mesh Morphing
V.I. Zhulin, S.J. Owen and D.F. Ostergaard

A Novel Approach to Simulate the Potential at the Center Axis of Poisson's Equation in Cylindrical Coordinates for Plasma Immersion Ion Implantation Processes
D.T.K. Kwok, Z.M. Zeng and P.K. Chu
City University of Hong Kong, CN

Nonlocal Problems in MEMS Device Control
J.A. Pelesko and A.A. Triolo
Georgia Institute of Technology, US

Closed-Loop, Neural Network Controlled Accelerometer Design
E.I. Gaura, N. Ferreira, R.J. Rider and N. Steele
Coventry University, UK

A Mathematical Model for Process Control in Laser Chemical Vapor Deposition
R. Nassar, W. Dai, C. Zhang, H. Lan and J. Maxwell
Louisiana Tech University, US

Discrete Impurity Effects in Silicon Quantom Dots
S.N. Milicic, D. Vasileska, R. Akis, A. Gunther and S.M. Goodnick
Arizona State University, US

ISBN: 0-9666135-7-0
Pages: 741