Index of Keywords


Random Dopant Induced Fluctuations of Characteristics in Deep Sub-micron MOSFETs

A Nano-Transistor with a Cavity

An A Priori Hysteresis Modeling Methodology for Improved Efficiency and Model Accuracy in Advanced PD SOI Technologies

Impacts of High-k Offset Spacer on 65-nm Node SOI Devices

Novel FD SOI Devices Structure for Low Standby Power Applications

Unified Approach to Bulk/SOI/UTB/s-DG MOSFET Compact Modeling

A Charge-Based Compact Model of Double Gate MOSFET

Compact Model Methodology for Dual-Stress Nitride Liner Films in a 90nm SOI ULSI Technology

Global MEMS Equipment and Materials Markets and Opportunities

Body Bias Dependency of Substrate Current and Its Modeling for SOI Devices

Design and implementation of silicon-based optical nanostructures for integrated photonic circuit applications using Deep Reactive Ion Etching (DRIE) technique

Evidence of the Existence of Complete Phononic Band Gaps in Phononic Crystal Plates

Model Implementation for Accurate Variation Estimation of Analog Parameters in Advanced SOI Technologies

Modeling of Floating-Body Devices Based on Complete Potential Description

Micro-Fabricated Electrostatic Voltage Sensor with a Thin Bulk-Silicon Device Layer

Effective Width Modeling for Body-Contacted Devices in Silicon-On-Insulator Technology

Monolithic CMOS MEMS technology development: A piezoresistive-sensors case study

Impact of Gate-Induced-Drain-Leakage current modeling on circuit simulations in 45nm SOI technology and beyond

Unified Regional Approach to High Temperature SOI DC/AC Modeling

SOI-Multi-FinFET: Impact of Fins Number multiplicity on Corner Effect