Index of Keywords


Suppression of Variability in Metal Source/Drain SOI MOSFET with Partial Buried Oxide and δ-doping

Development of a metrological scanning probe microscope as a primary standard for nanoscale dimensional measurement

Compact Negative Bias Temperature Instability Model for Nanoscale FinFET Reliability Simulation

nanoscale analysis

Local Electrode Atom Probes for 3-D Metrology

nanoscale anisotropic multilayers

Modeling of Light Reflection from Nanodimensional Anisotropic Multilayer Films on Isotropic Substrate

nanoscale architectures

A Nano-Scale Module with Full Spin-Wave Interconnectivity for Integrated Circuits

nanoscale bioconjugation

Attaching Biological Molecules to AFM Probes for Nanoscale Molecular Recognition Studies

nanoscale catalysts

Catalytic Biomass Reforming for Hydrogen and Hydrocarbon Production

nanoscale characterization techniques and applications

Transverse Elastic Modulus of Tobacco Mosaic Virus Superlattice

nanoscale chemistry

Modified AFM Probes for Nanoscale Biomolecular Recognition Studies

nanoscale circuits

Wire-Streaming Processors on 2-D Nanowire Fabrics

nanoscale CMOS circuit

Compact Modeling of Parameter Variations of Nanoscale CMOS due to Random Dopant Fluctuation

nanoscale contacts

Tailoring Molecular Devices for its Electronic Properties

nanoscale deposition

Dip Pen Nanolithography®: A Maturing Technology for High-Throughput Flexible Nanopatterning

Commercially Available High-Throughput Dip Pen Nanolithography®

nanoscale device

Process- and Random-Dopant-Induced Characteristic Variability of SRAM with nano-CMOS and Bulk FinFET Devices

Electrical Characteristics of Nanoscale Multi-Fin Field Effect Transistors with Different Fin Aspect Ratio

Generic Compact Model Development of Double-Gate MOSFETs with Inclusion of Different Operation Modes and Channels from Heavily Doped to Intrinsic Case

Analog/RF Performance Analysis of Coaxial Carbon Nanotube MOSFET from non-Equilibrium Green’s Function Simulation

Modeling of Dynamic Threshold Voltage of High K Gate Stack and Application in FinFET Reliability