BSIM Model for MOSFET Flicker Noise Statistics: Technology Scaling, Area, and Bias Dependence
1/f Noise Characterization of a Surface-Micromachined Suspended Gate FET
1/f Noise Model for Double-Gate FinFET Biased in Weak Inversion
Electrical Characteristics of 16-nm-Gate Multi-Gate-and-Multi-Fin Devices and Digital Circuits
Physics and Modeling of Noise in SiGe HBT Devices and Circuits
Parallel Pd Nanoribbons by Spontaneous Organization of Pd Nanoparticles
Fabrication of 1D nanochannels with thin glass wafers for single molecule studies