NSTI Nanotech 2009

Highly-parallel x-ray diffraction imaging for security screening applications

Geoffrey Harding

Geoffrey Harding

Chief Scientist
GE Security

Geoffrey Harding was intimately involved with the inception of x-ray diffraction imaging in the early 1980s, since when he has continued to pioneer this field and its main application of air passenger security screening. He is the author of many patents, publications and review articles in this field. He is Chief Scientist of GE Security in Hamburg, Germany, a world leader in the production and development of TSA-certified x-ray diffraction imaging equipment for air-passenger luggage screening.

Speaking in the symposium on Nanoscale Materials Characterization.

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