NSTI Nanotech 2009

Latest Developments in X-ray Photoelectron Spectroscopy and their application to Nanomaterials

D. Surman, C. Blomfield, S. Hutton, A. Roberts, S. Page, P. Butler, G. Mishra
Kratos Analytical Inc., US

Keywords: XPS, Surface Analysis, developments, instrumentation


The evolution and application of nanomaterials has increased rapidly over the last few years and with this increase has come a need to analyze and study their surface properties which greatly influences their performance in specific applications. X-ray Photoelectron Spectroscopy is an ideal tool for analyzing surface properties as it provides both elemental and chemical information simultaneously as well as information on their spatial distribution. This paper discusses the latest developments in XPS instrumentation and applications for the acquistion of nanoscale information.
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