2008 NSTI Nanotechnology Conference and Trade Show - Nanotech 2008 - 11th Annual

Partnering Events:

TechConnect Summit
Clean Technology 2008



ince more than 15 years researchers world-wide rely on the guaranteed high quality of NANOSENSORS™ probes for Atomic Force Microscopy and Scanning Probe Microscopy.

NANOSENSORS™ AFM tips are mainly used in university research and commercial R&D labs where high resolution, consistent quality and reproducibility of results are essential.

One example of the cutting-edge products offered by NANOSENSORS™ is the AdvancedTEC, the only AFM probe that offers real tip visibility from top. This feature makes it the premium choice for all applications where the tip has to be placed exactly on the point of interest or has to be visible (e.g. for nanomanipulation). Since this year this unique probe is also available with either gold or platinum iridium coating.

At NANOSENSORS™ R&D and production are working closely together ensuring a fast implementation of research results. Annual product introductions prove this dynamic.

NANOSENSORS™ is a trademark of NanoWorld AG.

Highlighted Products and Services

  • Pointprobe Plus XY-Allignment Silicon AFM Probes
  • AdvancesTEC AFM Probes
  • Probes for Magnetic Force Microscopy
  • SuperSharpSilicon AFM Probes
  • Plateau Tips

Booth: 911

Web site:

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