2008 NSTI Nanotechnology Conference and Trade Show - Nanotech 2008 - 11th Annual

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TechConnect Summit
Clean Technology 2008

Formation, trapping and electrical characterization of individual copper oxide nanocrystals

S. Sahoo, P.M. Ajayan
Rensselaer Polytechnic Institute, US

electric field, grwoth, nanowire

We report a simple method to form crystalline copper oxide nanostructures in a very controlled way. Isometric, platelet-like and needle like crystal structures have been observed. The formation of these nanocrystals was achieved by applying an electric field between two Cu electrodes of thickness 100nm deposited by electron-beam evaporation. We have investigated the interaction and the attachment of these crystals with carbon nanotubes under various conditions. Precise nanogap in single walled carbon nanotube based devices is used to trap these nanocrystals individually for electrical characterization. We have successfully demonstrated the trapping of a single nanocrystal of about 15-20 nm in width within the nanogap. Nonlinear electrical transport has been observed in the current-voltage characteristics of the individual trapped nanocrystal at room temparture. Demonstration of single crystal formation, trapping and electrical characterizations show the substantial achievement in studying the crystalline structures of copper oxide at nanoscale level. This has huge experimental potential in near future due to unusual magnetic and high-Tc superconducting properties of copper oxide. Furthermore, our current technique of production of nanocrystals and nanoparticles, trapping of these nanoparticles in the nanogap of SWCNT based device could be exploited for the various materials and thus their electrical response can be investigated at single nanocrystal level.

Nanotech 2008 Conference Program Abstract