2008 NSTI Nanotechnology Conference and Trade Show - Nanotech 2008 - 11th Annual

Partnering Events:

TechConnect Summit
Clean Technology 2008

Probing Nanoscale Mechanical and Thermal Properties of Heterostructured Polymeric Materials

G. Meyers, V. Ginzburg, H. Lakrout, B. McIntyre, M. Keefe, R. Drumright, K. Yang, A. Pasztor Jr., S. Magonov, N. Erina, L. Huang, C. Meyer, S. Belikov, C. Su, C. Prater
Dow Chemical, US

nanoindentation, latex, nanothermal, FEA, AFM

This contribution will describe two routes to obtaining a better understanding of the relationship between nanoscale properties and bulk material performance. In the first case we describe a new AFM-based nanoindenting capability which is optimized for quantitative, nanoscale mechanical measurements. We apply this capability to measure properties of sub-micron sized polystyrene latexes with hollow cores. We can probe the elastic response of the shell at low strain, the elasto-plastic response of the shell after yielding, and the gross buckling of the shell structure beyond plasticity. The data is further compared with FEA simulations from which additional parameters, such as yield stress, may be estimated. In the second case we describe the use of nanoscale thermal probes to provide local thermal analysis of heterogeneous materials. We first describe the correlation between bulk and local thermal measurements on standard polymeric materials which include semicrystalline, amorphous, and cross-linked systems. Correlations are drawn between bulk DSC, bulk TMA, and local nanoTA based measurements. Finally, examples of sub-micron thermal analysis and heated probe imaging of a co-extruded nanolayer material demonstrates the ability to easily obtain sub-250 nm thermal analysis.

Nanotech 2008 Conference Program Abstract