2007 NSTI Nanotechnology Conference and Trade Show - Nanotech 2007 - 10th Annual



NANOSENSORS™ is specialized on manufacturing cutting edge scanning probes for Atomic Force Microscopy (AFM) applications that are especially interesting for scientists at universities, research institutions and industrial R&D centers.

The product range comprises the PointProbe ® Plus AFM tip featuring a smaller tip radius and even less variation in tip shape as well as specialities like the AdvancedTEC probe offering real tip visibility from top, SuperSharp probes, High Aspect Ratio probes and Diamond Coated probes, self-sensing self-actuating probes. NANOSENSORS also offers many customized solutions including plateau, rounded and sphere shaped AFM tips. NANOSENSORS™ is a trademark of NanoWorld AG.

Booth: 407

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