2007 NSTI Nanotechnology Conference and Trade Show - Nanotech 2007 - 10th Annual

Current-induced Breakdown of Carbon Nanofibers Under Vacuum and Atmospheric Conditions

H. Kitsuki, Q. Ngo, M. Suzuki, K. Gleason, P. Wilhite, A.M. Cassell, C.R. Moylan, J. Li and C.Y. Yang
Santa Clara University, US

carbon nanofibers, current-induced breakdown, scanning transmission electron microscopy (STEM), thermal transport

Current-induced breakdown phenomena of carbon nanofibers (CNFs) for the development of carbon-based interconnects are investigated to reveal current-carrying capacity and reliability of CNF devices. Scanning transmission electron microscopy (STEM) techniques are developed to study the structural damage by current stress, including in-situ electrical measurement in STEM. The correlation between maximum current density and electrical resistivity confirms the importance of local Joule heating, showing strong coupling between electrical and thermal transport in CNFs.

Back to Program

Sessions Sunday Monday Tuesday Wednesday Thursday Authors Keywords

Nanotech 2007 Conference Program Abstract


Names, and logos of other organizations are the property of those organizations and not of NSTI.
This event is not open to the general public and NSTI reserves the right to refuse admission and participation to any individual.