2007 NSTI Nanotechnology Conference and Trade Show - Nanotech 2007 - 10th Annual

Rapid, non invasive, multi-length scale 3D characterization of biomaterials with a novel CT - with resolution from mm to sub 30 nm

S.H. Lau, S. Ho and A. Peele
Xradia Inc, US

biomaterials, multilength scale CT, non invasive characterization, tissue engineering

Biomaterials are difficult to image with conventional imaging techniques because of their inherently low contrast. The difficulty increases if we need to characterize their internal structures since tedious sample preparation and cross sectioning is required, which may introduce artifacts, especially when these materials are hard, brittle, soft, moist or elastic. Spatial resolution of Optical and confocal microscopy is generally no better than 200 nm in the best case. To obtain higher imaging resolution, scanning or transmission electron microscopy (SEM or TEM) or atomic force microscopy (AFM) is employed. These state of the art resolution techniques can achieve spatial resolution in the nm with lengthscale on the order of angstroms, however, sample preparation for these techniques can be very elaborate. Samples for electron microscopy for instance, require compatibility with high vacuum and be electrically conductive. Besides, it is difficult to visualize internal 3D arrays and pores of biomaterials based on 2D images alone. We describe a novel micro-nano x-ray computer tomography (CT) system for rapid non invasive multi-length scale characterization of internal structures of biomaterials in 3D, from mm to sub 30 nm spatial resolution. System supports specimen sizes ranging from several cm to microscopic dimensions. Several examples of biomaterials from biological structures to tissue engineering scaffold and biomaterial-metal interfacial studies will be presented

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Nanotech 2007 Conference Program Abstract


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