2007 NSTI Nanotechnology Conference and Trade Show - Nanotech 2007 - 10th Annual

On the Road to Nano: A Database for Microsystems Materials

C.K. Drummond
ASM International, US

Microsystems, MEMS, materials, cahracterisation, simulation

Despite tremendous progress in simulation software development for Microsystems product design, a limiting factor to practical applications tends to be with materials characterization. To advance the state-of-the art in simulation and related educational efforts, ASM International has completed the first of three phases of a unique database product development effort. Phase 1 focused on Microsystems packaging processes and materials, phase 2 will address the more general case of Microsystems materials, and phase 3 will extend the materials characterization effort into the nanotechnology domain. The current work discusses the “strides and stumbles” associated with a materials characterization database system being developed, and identifies (and welcomes) opportunities for collaboration with other research groups, particularly in the area of material reliability and survivability for harsh environment life prediction efforts.

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Nanotech 2007 Conference Program Abstract


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