Nanotech 2014 Vol. 2
Nanotech 2014 Vol. 2
Nanotechnology 2014: MEMS, Fluidics, Bio Systems, Medical, Computational & Photonics

WCM - Compact Modeling Chapter 8

Modeling of Short-Channel Effect for Ultra-Thin SOI MOSFET on Ultra-Thin BOX

Authors: H. Miyamoto, Y. Fukunaga, H. Zenitani, K. Kikuchihara, H.J. Mattausch, M. Miura-Mattausch

Affilation: Hiroshima University, Japan

Pages: 471 - 474

Keywords: modeling, investigation, simulation

The SOTB-MOSFET (ultra-thin film SOI layer on ultra-thin BOX) is a candidate for the next MOSFET generations with advanced technology due to its suppression of the short-channel effect. Besides, the thin box layer can well control its threshold voltage by varying back-gate voltage from negative to positive. Charges induced within the device are not only located at the front gate but also at the back gate, depending on the bias conditions. With the complete surface-potential-based compact model HiSIM-SOTB separation of the front-gate current and the back-gate current becomes possible, and is used to analyze the short-channel effect independently. We propose an analytical Vth model describing the short-channel effect considering both charges induced at the front gate as well as the back gate accurately. It is also demonstrated that the influence of the technological variations on Vth is enhanced for the SOTB generation.

ISBN: 978-1-4822-5827-1
Pages: 570
Hardcopy: $209.95