Nanotech 2013 Vol. 2
Nanotech 2013 Vol. 2
Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational (Volume 2)

NanoFab: Manufacturing & Instrumentation Chapter 6

Compact MEMS/NEMS Characterization Platform Using a DVD Optical Pick-up Unit with Optical Imaging Function

Authors: C-H Chen, T. Larsen, S. Schmid, H-S Liao, I-S Hwang, A. Boisen, E-T Hwu

Affilation: Academia Sinica, Taiwan

Pages: 485 - 488

Keywords: MEMS, NEMS, characterization

Abstract:
We present a compact, simple and efficient platform for MEMS/NEMS characterization. In this platform, a DVD optical pickup unit (OPU) is combined with a CCD camera. A nano-scale resolution long range X-Y-Z linear stage below the sample is used for coarse adjustments. The DVD OPU is capable of detecting resonant frequencies of MEMS/NEMS structures. The working bandwidth and noise level of the OPU are 100 MHz and 1.3 pmHz^-1/2, respectively. Furthermore, the OPU has sub-micron laser spot size of 560 nm (FWHM), which facilitates optical measurements on sub-micrometer wide cantilevers. Both thermal noise and excited resonant frequencies of micrometer sized cantilevers/strings can be measured.


ISBN: 978-1-4822-0584-8
Pages: 808
Hardcopy: $209.95

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