Nanotech 2013 Vol. 2
Nanotech 2013 Vol. 2
Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational (Volume 2)

NanoFab: Manufacturing & Instrumentation Chapter 6

Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tips

Authors: M. Lanza, A. Bayerl, M. Reguant, P. Lv, C. Rubio, M. Porti, M. Nafria, H.L. Duan

Affilation: Peking University, China

Pages: 466 - 469

Keywords: graphene, CAFM, tip wearing, electrochemical metallization, CVD

Electrical characterization at the nanoscale is an essential procedure for analyzing the performance of many materials used at both industry and academia. In this field, one of the most powerful tools is the Conductive Atomic Force Microscope (CAFM), which can characterize the electrical properties of both conductive and thin insulating materials at areas as small as 3 nm2. The main challenge associated with this technique is the poor reliability of the tips, which metallic varnish can wear out very fast due to high current densities and frictions when scanning the surface of the sample under test. In this work, we successfully fabricated conductive tips for the CAFM that show ultra-high performance, by coating commercially available metal-varnished tips with a sheet of GSL following the standard transfer process. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available metal-varnished CAFM tips, leading to much longer lifetimes and preventing false imaging due to tip-sample interaction. The novel devices can be interesting not only for reducing tip replacement costs, but also for those applications that require high stability and low tip-sample interaction (e.g., resistive switching).

ISBN: 978-1-4822-0584-8
Pages: 808
Hardcopy: $209.95