NanoFab: Manufacturing & Instrumentation

Papers:

Direct Observation of Nanofabrication using the Optical Microscope combined with Nanopipette/QTF-AFM System

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We demonstrated direct observation of nanofabrication using the optical microscope (OM) combined with nanopipette/QTF-AFM (Quartz Tuning Fork-Atomic Force Microscopy) system. Various solutions are ejected onto the substrate through the nano-/micro-aperture of the pulled pipette, and [...]

Journal: TechConnect Briefs
Volume: 2, Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational (Volume 2)
Published: May 12, 2013
Industry sector: Advanced Materials & Manufacturing
Topics: Advanced Manufacturing, Nanoelectronics
ISBN: 978-1-4822-0584-8