Nano Science and Technology Institute
Nanotech 2012 Vol. 2
Nanotech 2012 Vol. 2
Nanotechnology 2012: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational (Volume 2)

Chapter 6:

Micro & Nano Reliability

-Modeling of Dynamic Threshold Voltage of High K Gate Stack and Application in FinFET Reliability
 H. He, C. Ma, C. Wang, A. Zhang, J. He
 Peking Univeristy, CN
-Functional Performance of Microfluidic On-Board Pumps and Valves with Various Actuation Protocols
 J. Podczeviensky, J. McDowell, L. Levine
 ALine, Inc., US
-Shock Testing of Free Standing Silicon-Nitride and Beryllium Membranes
 D. Brough, L. Barrett, R. Vanfleet, R. Davis, S. Liddiard, S. Cornaby, M. Coffin
 Brigham Young University, US
-Nanoscale deformation analysis for fracture mechanical evaluation of interface cracks in electronic packages.
 J. Keller, M. Schulz, R. Mrossko, B. Wunderle, B. Michel
 AMIC Angwandte Micro-Messtechnik GmbH, DE
-Reliability Prediction of Single-Crystal Silicon MEMS Using Dynamic Raman Spectroscopy
 R. Dewanto, Z. Hu, B. Gallacher, J. Hedley
 Newcastle University, UK
-Detecting Defects over the Whole Surface of Wafer by Non-destructive and Non-contact Pulse Photoconductivity Method (PPCM)
 J. Ndagijimana, Y. Soh, H. Kubota, K. Kobayashi
 Kumamoto University, JP
-Experimental analysis of the MEMS Capacitive accelerometer’s shock resistibility
 Y. Tao, Y. Liu, J. Dong
 Tsinghua University, CN
-Impact of Channel Length and Gate Width of a N-MOSFET Device on the Threshold Voltage and its Fluctuations in Presence of Random Channel Dopants and Random Interface Trap: A 3D Ensemble Monte Carlo Stud
 N. Ashraf, S. Joshi, D. Vasileska
 ASU, US
ISBN:978-1-4665-6275-2
Pages:878
Hardcopy:$209.95
 
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