Nanotech 2012 Vol. 1
Nanotech 2012 Vol. 1
Nanotechnology 2012: Advanced Materials, CNTs, Particles, Films and Composites (Volume 1)

Nanoscale Materials Characterization Chapter 1

AM-­FM and Loss Tangent Imaging-Two New Tools for Quantitative Nanomechanical Properties

Authors: R. Proksch, I. Revenko, S. Hohlbach, J. Cleveland, N. Geisse, A. Moshar, J. Bemis, C. Callahan

Affilation: Asylum Research, United States

Pages: 27 - 30

Keywords: AM-FM, materials characterization

Abstract:
see attached abstract


ISBN: 978-1-4665-6274-5
Pages: 804
Hardcopy: $209.95