Nano Science and Technology Institute
Nanotech 2012 Vol. 1
Nanotech 2012 Vol. 1
Nanotechnology 2012: Advanced Materials, CNTs, Particles, Films and Composites (Volume 1)
 
Chapter 1: Nanoscale Materials Characterization
 

AM-­FM and Loss Tangent Imaging-Two New Tools for Quantitative Nanomechanical Properties

Authors:R. Proksch, I. Revenko, S. Hohlbach, J. Cleveland, N. Geisse, A. Moshar, J. Bemis, C. Callahan
Affilation:Asylum Research, US
Pages:27 - 30
Keywords:AM-FM, materials characterization
Abstract:see attached abstract
ISBN:978-1-4665-6274-5
Pages:804
Hardcopy:$209.95
 
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