AM-FM and Loss Tangent Imaging-Two New Tools for Quantitative Nanomechanical Properties

	Nanotech 2012 Vol. 1 Nanotechnology 2012: Advanced Materials, CNTs, Particles, Films and Composites (Volume 1) Chapter 1: Nanoscale Materials Characterization
	AM-FM and Loss Tangent Imaging-Two New Tools for Quantitative Nanomechanical Properties
Authors:	R. Proksch, I. Revenko, S. Hohlbach, J. Cleveland, N. Geisse, A. Moshar, J. Bemis, C. Callahan
Affilation:	Asylum Research, US
Pages:	27 - 30
Keywords:	AM-FM, materials characterization
Abstract:	see attached abstract
ISBN:	978-1-4665-6274-5
Pages:	804
Hardcopy:	$209.95

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AM-­FM and Loss Tangent Imaging-Two New Tools for Quantitative Nanomechanical Properties