Nanotech 2012 Vol. 1
Nanotech 2012 Vol. 1
Nanotechnology 2012: Advanced Materials, CNTs, Particles, Films and Composites (Volume 1)

Nanoscale Materials Characterization Chapter 1

Comprehensive Microscopy Analysis of Au/Ag Nanoclusters on Silica Nanospheres

Authors: H. Qian, W. Shen, K. Cui, J. Cho, H. Fenniri

Affilation: National Institute for Nanotechnology, Canada

Pages: 87 - 90

Keywords: TEM, tomography, HAADF, HRTEM, SERS

Abstract:
we report a comprehensive structural and morphological analysis of gold (Au) / silver (Ag) nanocluster (shell) on silica (SiO2) nanosphere (core) with transmission electron microscopy (TEM) based techniques, including scanning transmission electron microscopy (STEM) tomography, high angle angular dark field (HAADF) imaging, energy dispersive X-ray (EDX), high resolution TEM (HRTEM) and nano beam diffraction (NBD). This comprehensive microscopy analysis not only characterizes the shape, structure, and composition of Au/Ag nanoparticles on the surface of SiO2 nanospheres but it also allows us to better understand the mechanisms and control the growth of Au/Ag alloy. As a result, significantly improved SERS properties could be achieved.


ISBN: 978-1-4665-6274-5
Pages: 804
Hardcopy: $209.95