Authors: S.K. Sharma, S. Mohan
Affilation: Indian Institute of Science, Bangalore, India
Pages: 336 - 339
Keywords: shape memory alloys (SMA), magnetron sputtering, focused ion beam (FIB) micro-machining, scanning electron microscopy, nano-mechanical testing
Focused Ion Beam (FIB) micro-machining technique has been used to generate various nano-structures on NiTi shape memory alloy films. The fabrication and nano-mechanical investigations of the nano-structures have been included in this paper.