Nanotech 2011 Vol. 2
Nanotech 2011 Vol. 2
Nanotechnology 2011: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational

Micro & Nano Reliability Chapter 3

Automated test system for in-situ testing of reliability and aging behaviour of thermal interface materials

Authors: M. Abo Ras

Affilation: Berliner Nanotest and Design GmbH, Germany

Pages: 159 - 163

Keywords: thermal Interface Materials, thermal resistance, thermal conductivity, thermal characterization, reliability test, material aging, TIM delamination, greases pump-out

Abstract:
The on-going need for miniaturization and speed in electronics industry has brought a requirement for better performing thermal management systems. Therefore we have developed a test stand to characterize the aging behaviour of most common thermal interface materials (TIMs).


ISBN: 978-1-4398-7139-3
Pages: 854
Hardcopy: $199.95

2015 & Newer Proceedings

Nanotech Conference Proceedings are now published in the TechConnect Briefs

NSTI Online Community