Nano Science and Technology Institute
Nanotech 2011 Vol. 2
Nanotech 2011 Vol. 2
Nanotechnology 2011: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational
 
Chapter 3: Micro & Nano Reliability
 

Automated test system for in-situ testing of reliability and aging behaviour of thermal interface materials

Authors:M. Abo Ras
Affilation:Berliner Nanotest and Design GmbH, DE
Pages:159 - 163
Keywords:thermal Interface Materials, thermal resistance, thermal conductivity, thermal characterization, reliability test, material aging, TIM delamination, greases pump-out
Abstract:The on-going need for miniaturization and speed in electronics industry has brought a requirement for better performing thermal management systems. Therefore we have developed a test stand to characterize the aging behaviour of most common thermal interface materials (TIMs).
ISBN:978-1-4398-7139-3
Pages:854
Hardcopy:$199.95
 
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