Nanotech 2011 Vol. 2
Nanotech 2011 Vol. 2
Nanotechnology 2011: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational

Nano Electronics & Photonics Chapter 1

Nanoporous thin-film waveguide resonance sensors with wavelength interrogation over a broad bandwidth

Authors: Z-M Qi, Z. Zhang, Q. Liu, D. Lu

Affilation: Institute of Electronics, Chinese Academy of Sciences, China

Pages: 80 - 83

Keywords: nanoporous thin-film waveguide, resonance wavelength, ultrahigh sensitivity

Abstract:
Nanoporous dielectric film based leaky-mode waveguide resonance sensors have attracted considerable attention because of their interesting features [1-4]. Such sensors generally operate in the angular interrogation mode [1-3]. The first application of the wavelength interrogation mode to nanoporous waveguide resonance sensors was demonstrated in our previous work [4]. This study shows the new results obtained most recently using the wavelength-interrogating nanoporous waveguide resonance sensor. The sensor is able to detect CTAB (a small-molecule surfactant) in the aqueous solution (Fig 2). A small increase in refractive index (RI) of the surrounding liquid can also result in a large blue shift in the resonance wavelength of the sensor (Fig.3). In this case, the RI sensitivity of the sensor is much larger than that of a conventional SPR sensor with a naked gold layer [5].

Nanoporous thin-film waveguide resonance sensors with wavelength interrogation over a broad bandwidth

ISBN: 978-1-4398-7139-3
Pages: 854
Hardcopy: $199.95