Nanotech 2010 Vol. 2
Nanotech 2010 Vol. 2
Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational

Sensing Systems & Wireless Networks Chapter 7

Development of Quantitative Adhesive Force Measurement Systems for Flexible Electronics

Authors: M. Kim, J. Park, B. Choi

Affilation: Sogang University, Korea

Pages: 405 - 408

Keywords: adhesive force

Abstract:
In this paper, a novel adhesive force measurement system is developed to measure adhesive forces from interacting surfaces. In previous paper, the adhesive force was measured with tens/hundreds of uN, and the displacement was measured with tens of nm resolution. Here, we used a high resolution force sensor and a high resolution z-stage to increase sensitivity in adhesive force measurement with under a few uN and tens of nm resolution. The force measurement part is fixed on a uniformly drilling plate, which assembled manual z-stage, piezo z-stage, and force sensor. Using the force sensor in the adhesive force measurement system, a pull-off force of an adhesive layer is measured. At this time, we measured multiple sections of the 300 mm width film. Database, that is the measured pull-off force of each adhesive layer was created.

Development of Quantitative Adhesive Force Measurement Systems for Flexible Electronics

ISBN: 978-1-4398-3402-2
Pages: 862
Hardcopy: $189.95