 | Nanotech 2010 Vol. 1
Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites
Chapter 1: Nanoscale Materials Characterization |
Individual SiGe Nanowire Chemical Composition Depth Profiling and Surface Oxidation Analyzed by Auger Electron Spectroscopy | |
| Authors: | J.S. Hammond, U. Givan, D. Paul, F. Patolsky |
| Affilation: | Physical Electronics USA, US |
| Pages: | 21 - 24 |
| Keywords: | nanowire, SiGe, Auger electron spectroscopy |
| Abstract: | The lateral and depth distributions of the surface oxidation and the surface Phosphorous doping concentrations have been measured from an individual SixGe(1-x) 60 nm diameter nanowire with Auger Electron Spectroscopy combined with sputter ion depth profiling. The surface imaging spectroscopy characterization of the CVD-LVS grown nanowires interpret the conductivity measurements of the nanowires. |
| ISBN: | 978-1-4398-3401-5 |
| Pages: | 976 |
| Hardcopy: | $189.95 |
| Order: | Mail/Fax Form |
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