Nanotech 2010 Vol. 1
Nanotech 2010 Vol. 1
Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites

Nanoscale Materials Characterization Chapter 1

Advanced nanoscale elastic property measurement by contact-resonance atomic force microscopy

Authors: G. Stan, R.F. Cook

Affilation: National Institute of Standards and Technology, United States

Pages: 1 - 4

Keywords: nanoscale mechanical measurements, dynamic AFM

Abstract:
In the past few years, we have improved and developed the capabilities of CR-AFM in various ways: established clear criteria for assessing the precision and accuracy in CR-AFM measurements, introduced a load-dependent CR-AFM protocol suitable for elastic modulus measurements on compliant materials, and tested the suitability of CR-AFM measurements on various materials with elastic moduli in the range of GPa to hundreds of GPa. We have also extended CR-AFM applicability to quantitative elastic modulus measurements on various one-dimensional nanostructures (nanowires and nanotubes). Another valuable CR-AFM application has been the interrogation of elastic properties at the nanoscale of granular nanocrystalline surfaces and thin films. By combining the CR-AFM point measurements with AFM scanning capability, the elastic modulus was mapped with better than 10 nm spatial resolution. To determine the elastic modulus from CR-AFM measurements on such granular surfaces, both topography and contact stiffness maps were self-consistently correlated.

Advanced nanoscale elastic property measurement by contact-resonance atomic force microscopy

ISBN: 978-1-4398-3401-5
Pages: 976
Hardcopy: $189.95