 | Nanotech 2010 Vol. 1
Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites
Chapter 1: Nanoscale Materials Characterization |
Advanced nanoscale elastic property measurement by contact-resonance atomic force microscopy | |
| Authors: | G. Stan, R.F. Cook |
| Affilation: | National Institute of Standards and Technology, US |
| Pages: | 1 - 4 |
| Keywords: | nanoscale mechanical measurements, dynamic AFM |
| Abstract: | In the past few years, we have improved and developed the capabilities of CR-AFM in various ways: established clear criteria for assessing the precision and accuracy in CR-AFM measurements, introduced a load-dependent CR-AFM protocol suitable for elastic modulus measurements on compliant materials, and tested the suitability of CR-AFM measurements on various materials with elastic moduli in the range of GPa to hundreds of GPa. We have also extended CR-AFM applicability to quantitative elastic modulus measurements on various one-dimensional nanostructures (nanowires and nanotubes). Another valuable CR-AFM application has been the interrogation of elastic properties at the nanoscale of granular nanocrystalline surfaces and thin films. By combining the CR-AFM point measurements with AFM scanning capability, the elastic modulus was mapped with better than 10 nm spatial resolution. To determine the elastic modulus from CR-AFM measurements on such granular surfaces, both topography and contact stiffness maps were self-consistently correlated. |
| ISBN: | 978-1-4398-3401-5 |
| Pages: | 976 |
| Hardcopy: | $189.95 |
| Order: | Mail/Fax Form |
| Special: | 3 CD Set — 15% off with Free Shipping |
| Up |
© 2013 Nano Science and Technology Institute. All Rights Reserved.
Terms of Use | Privacy Policy | Contact Us | Site Map
Terms of Use | Privacy Policy | Contact Us | Site Map