Nanotech 2009 Vol. 3
Nanotech 2009 Vol. 3
Nanotechnology 2009: Biofuels, Renewable Energy, Coatings, Fluidics and Compact Modeling

Workshop on Compact Modeling Chapter 9

Compact Model of Low – Frequency Noise in Nanoscale Metal-Oxide-Semiconductor Field Effect Transistors

Authors: D.A. Miller, M.E. Jacob, L. Forbes

Affilation: Oregon State University, United States

Pages: 632 - 635

Keywords: low frequency noise, random telegraph signals, RTS, MOSFET noise

Abstract:
At nanoscale device dimensions low frequency noise is dominated by one or more oxide traps capturing and emitting charge and generating large swings in the drain current or what is known as Random Telegraph Signal (RTS). Fluctuations in oxide trap and dopant distributions create wide variations in low frequency noise from otherwise identical devices. A compact low frequency noise model presented here accounts for the action of traps on percolating currents in deep submicron and sub-100nm MOS transistors.

Compact Model of Low – Frequency Noise in Nanoscale Metal-Oxide-Semiconductor Field Effect Transistors

ISBN: 978-1-4398-1784-1
Pages: 694
Hardcopy: $179.95