Preparation of Y3Al5O12:Eu3+ waveguide films by sol-gel method

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In this work, Y3Al5O12:Eu3+ (5 mol% Eu3+) optical thick films were obtained by sol-gel process. The films were dip-coated by dip-coating technique. The synthesis was accomplished using metal organic precursors, such as Al(tri-sec-butoxide) Al(OC4H9)3, yttrium chloride YCl3 6H2O, isopropanol and europium nitrate Eu(NO3)3•5H2O. The chelating agent was 2,4 pentanedione (CH3COCH2COCH3, acacH). After the precursor sol deposition stage, the YAG:Eu3+ films were dried and annealed at for 1 hour at 700 °C, 900 °C and 1100 °C. Multilayers were deposited to obtain multimode waveguides. The as-prepared thick films were structurally examined by XRD, AFM, SEM, HRTEM and m-lines spectroscopy. X-Ray diffraction analysis confirmed that Y3Al5O12:Eu3+ films presented the characteristic XRD pattern of YAG. Microscopic examination (HRTEM) of the films heat-treated at 1100 °C revealed that the YAG:Eu3+ films were constituted of particles with diameters of about 25 nm (Fig.1). The optogeometrical characteristics as thickness and refractive index were performed using the M-Lines Spectroscopy (MLS) using a He-Ne laser (632.8 nm). These results showed that the thickness and refractive index of the Y3Al5O12:Eu3+ film after a heating treatment at 1100 °C were 1.3 µm and 1.6385 respectively.

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Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics
Published: May 3, 2009
Pages: 383 - 386
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-1782-7