In-Situ Nanomechanical-Electrical Testing of One-Dimensional Materials

	Nanotech 2009 Vol. 1 Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics Chapter 4: Nanoscale Characterization
	In-Situ Nanomechanical-Electrical Testing of One-Dimensional Materials
Authors:	R.S. Yassar, Y.K. Yap
Affilation:	Michigan Technological University, US
Pages:	318 - 322
Keywords:	TEM, AFM, STM, in-situ, Nanotube
Abstract:	One-dimensional nanomaterials including nanotubes are building blocks for constructing various complex nanodevices. Boron nitride (BN) nanotubes with structure similar to carbon nanotube are known to be among the strongest insulators in the world. In this work, deformation of an individual BN nanotube is performed inside a high-resolution transmission electron microscope (TEM) using a piezo-driven atomic force microscope (AFM) and scanning tunneling microscope (STM)–TEM holder. The electrical and mechanical properties of individual BN nanotubes are obtained from the experimentally recorded I-V and force-displacement curves.
ISBN:	978-1-4398-1782-7
Pages:	702
Hardcopy:	$179.95

Order:	Mail/Fax Form
Special:	3 CD Set — 15% off with Free Shipping
Up