![]() | Nanotech 2009 Vol. 1
Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics
Chapter 4: Nanoscale Characterization |
Characterization of Silane Nanoadhesion by means of Dynamic Force Spectroscopy | |
| Authors: | A. Ptak, M. Makowski, M. Niemier, M. Cichomski, H. Gojzewski and R. Czajka |
| Affilation: | Poznan University of Technology, PL |
| Pages: | 281 - 284 |
| Keywords: | adhesion, force spectroscopy, interaction potential, adhesive bonds |
| Abstract: | Using a modified atomic force microscope the nanoadhesion between a silicon tip and a monolayer of 1H, 1H, 2H, 2H-perfluorodecyl-trichlorosilane was measured at different loading rates. Adhesion force-versus-loading rate curves could be fitted with two logarithmic terms, indicating a two-energy-barrier interaction potential.The application of the Bell-Evans model to the analysis of the curves allowed extracting quantitative information about the effective adhesion potential and characterizing the different components contributing to the nanoadhesion. Although van der Waals interactions appear only major contribution to the nanoadhesion, the interaction potential characterizing the nanoadhesion has still a complex, two-barrier character. |
| ISBN: | 978-1-4398-1782-7 |
| Pages: | 702 |
| Hardcopy: | $179.95 |
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