Nanotech 2008 Vol. 3
Nanotech 2008 Vol. 3
Nanotechnology 2008: Microsystems, Photonics, Sensors, Fluidics, Modeling, and Simulation - Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, Volume 3

Compact Modeling Chapter 7

A Technique for Constructing RTS Noise Model Based on Statistical Analysis

Authors: C-Q Wei, Y-Z Xiong, X. Zhou

Affilation: Nanyang Technological University, Singapore

Pages: 885 - 888

Keywords: RTS noise model, Pulse amplitude, Pulse width, Pulse delay

Abstract:
In this paper, a technique for constructing the RTS noise model based on the statistical analysis of the noise data obtained from the Schottky diode under different biases is introduced. The three RTS parameters: pulse amplitude, pulse width and pulse delay are very important, since the RTS noise model was built up based on the statistical distributions of these three parameters. From the comparisons of the distributions, it is shown that the difference between the modeled RTS and measured RTS is quite small, and this model is useful in generating noise data because it is closely matched to the measured noise.


ISBN: 978-1-4200-8505-1
Pages: 940
Hardcopy: $159.95

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