Nanotech 2008 Vol. 3
Nanotech 2008 Vol. 3
Nanotechnology 2008: Microsystems, Photonics, Sensors, Fluidics, Modeling, and Simulation - Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, Volume 3

Compact Modeling Chapter 7

Unified Regional Surface Potential for Modeling Common-Gate Symmetric/Asymmetric Double-Gate MOSFETs with Quantum-Mechanical Effects

Authors: G.H. See, X. Zhou, G. Zhu, Z. Zhu, S. Lin, C. Wei, J. Zhang, A. Srinivas

Affilation: Nanyang Technological University, Singapore

Pages: 756 - 759

Keywords: quantum mechanical effect, asymmetric double-gate, MOSFETs, unified regional

Abstract:
The quantum mechanical effect (QME) in nanoscale MOSFETs has become more and more important. The quantization of the space charge density in bulk-MOS compact models is usually modeled by the van Dort model with a simple modification of intrinsic carrier density. However, for double-gate MOSFET compact modeling, there is no simple solution even without considering the QME. In this work, the QM correction in explicit surface potential for bulk-MOS is extended to common-gate asymmetric double-gate MOSFET modeling. The transition from partially depleted to fully-depleted operation is seamlessly built into the model without any fitting parameters. The surface potential can be applied to the drain current model as it contains the essential physics that scales with the DG MOSFET structures.

Unified Regional Surface Potential for Modeling Common-Gate Symmetric/Asymmetric Double-Gate MOSFETs with Quantum-Mechanical Effects

ISBN: 978-1-4200-8505-1
Pages: 940
Hardcopy: $159.95