 | Nanotech 2008 Vol. 3
Nanotechnology 2008: Microsystems, Photonics, Sensors, Fluidics, Modeling, and Simulation - Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 3: Lab-on-a-Chip, Micro & Nano Fluidics |
Understanding Conduction Mechanisms in Nano-Structures | |
| Authors: | V.H. Gehman Jr, K.J. Long, F. Santiago, K.A. Boulais, A.N. Rayms-Keller |
| Affilation: | Naval Surface Warfare Center, Dahlgren Division, US |
| Pages: | 409 - 412 |
| Keywords: | nanostructure, ionic conductor, electrical properties |
| Abstract: | Many technologies require the understanding of conduction and electrical transport mechanisms through nanostructures. Previous research has revealed unusual and enhanced conduction properties in pores whose width is significantly less than 1 m over a range of +10V to -10V. Characterization of the enhanced conduction will include experimental measurements and theoretical models looking to explain the effects of nanopore size, bulk ionic concentration, solute ionic charge, solvent, semiconductor versus metallic contacts and voltage upon conduction current. The model will attempt to adapt the concepts of the ionic atmosphere, dielectric effects at interfaces, ionic density and mobility to the unique environment within the nanopore. By exploiting the enhanced current, there exists the potential for order-of-magnitude improvements in sensors, computation and communications. Conduction and attachment mechanisms are the cornerstone to the successful integration of nano-devices into Naval systems using conventional semiconductors. |
| ISBN: | 978-1-4200-8505-1 |
| Pages: | 940 |
| Hardcopy: | $159.95 |
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