Nano Science and Technology Institute
Nanotech 2008 Vol. 3
Nanotech 2008 Vol. 3
Nanotechnology 2008: Microsystems, Photonics, Sensors, Fluidics, Modeling, and Simulation - Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 2: Sensors & Systems

Pressure sensor data processing for vertical velocity measurement

Authors:M. Husak, J. Jakovenko, L. Stanislav
Affilation:Czech Technical University in Prague, CZ
Pages:178 - 181
Keywords:sensor, pressure, vertical velocity, distortion, compensation, temperature, microprocessor
Abstract:There are design and realization of a sensor system for vertical velocity measurement using pressure sensor in the paper. Problem of nonlinearity due to the exponential function of air pressure versus altitude is discussed in detail. The possibility of nonlinearity compensation using a complementary function, temperature compensation. The transient analysis of the electronic circuit connection was used for vertical velocity simulation. The system solution is based on the basic equation for altitude calculation, including the effects of temperature. A linear interpolation function is used to speed up the altitude calculation. The calibration of the designed system is performed. An electronic circuit was designed, taking care of the mathematical functions including compensation functions. The type MPX4115 pressure sensor was used in the system. The system is controlled by an ATMega16 microprocessor. The system communicates with a PC. The measurements, calculations and other system activities are controlled by the specially designed software. The drivers were designed in the C language. A new method for distortion correction was used, for algorithm simplification and system linearization. New assets are represented by the new electronic circuit blocks. The effort is targeted for algorithm of velocity measurement development, including distortion corrections and temperature compensation.
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