Nanotech 2008 Vol. 1
Nanotech 2008 Vol. 1
Nanotechnology 2008: Materials, Fabrication, Particles, and Characterization - Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, Volume 1

Characterization Chapter 6

Mechanical characterization of electrostatic MEMS switches

Authors: F. Souchon, A. Koszewski, D. Levy, PL. Charvet

Affilation: CEA/LETI/MINATEC, France

Pages: 885 - 888

Keywords: MEMS, nanoindentation, stiffness, gap height, mechanical model

Abstract:
The paper presents a methodology with nanoindentation experiments to characterize the mechanical properties of MEMS switches. After that, simple analytical models for mechanical and electrostatic aspects are used to validate these mechanical characterizations. At the end, the electrostatic behavior of switches are well-understood thanks to the mechanical charaterizations. the complete abstract is avalaible in a pdf file


ISBN: 978-1-4200-8503-7
Pages: 1,118
Hardcopy: $159.95

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