Preparation and Characterization of Bi-2212 thin films using pulsed laser depostion technique

	Nanotech 2008 Vol. 1 Nanotechnology 2008: Materials, Fabrication, Particles, and Characterization - Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, Volume 1 Chapter 6: Characterization
	Preparation and Characterization of Bi-2212 thin films using pulsed laser depostion technique
Authors:	N.T. Mua, C.N.R. Rao, A. Sundaresan, T.D. Hien, N.K. Man
Affilation:	Hanoi University of Technology, VN
Pages:	1030 - 1033
Keywords:	Bi-2212 thin films, pulsed laser deposition
Abstract:	The surface morphology, microstructure and transport properties of the thin films are clearly a function of deposition temperature and post-annealing conditions.It is seen from our experimental data that post- annealing is required to obtain a single phase and to form a smooth surface. Also, the critical temperature is increased due to post annealing.The recrystallized films showed a leaf -like grain morphology and a significant improve ment of Tc, strongly suggesting that the process of amorphization by thermal annealing maybe an effective way to obtain a c-axis oriented Bi-2212 films with improved superconducting properties.
ISBN:	978-1-4200-8503-7
Pages:	1,118
Hardcopy:	$159.95

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