Nano Science and Technology Institute
Nanotech 2007 Vol. 4
Nanotech 2007 Vol. 4
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
 
Chapter 3: Nanofabrication
 

Simulation of Virtual Nanoparticle tracking using calculated forces for an Atomic Force Microscope and Optical Tweezers

Authors:S.N. Dwivedi, S. Kode and P.G. Ikonomov
Affilation:Universtiy of Louisiana, Lafayette, US
Pages:473 - 481
Keywords:virtual, nano particle, manipulation, atomic force
Abstract:Nanomanufacturing necessitates manipulation of nanoparticles in order to build functional three dimensional structures. Manipulation of nanoparticles takes place in microenvironments where it is not practical for the user to manually interact with the nanoparticles. So far, there is not a standard device that has been used to manufacture products at nanoscale. In order to achieve effectiveness and reliability in the field of nanomanufacturing and nanoassembly, it is necessary to study the forces exerted on nanoparticles, interaction between the manipulation devices, and the substrate on which the particles are present. In this situation, Virtual Reality (VR) techniques not only comes to our aid to help guide these manipulations, but also allows the user to virtual present in these microenvironments. This paper proposes a VR technique to track the movement of the nanoparticles during the interaction with atomic force microscope and optical tweezers using simulated forces. The forces considered during the process include both contact and non-contact forces experienced by the nanoparticles. Using the standard equations, these forces were calculated in MatLab and provided as input to the VR software (Eon Reality) to represent the direction of particle movement. Visualization and control of nanoparticle movement is demonstrated by varying the force inputs. Once optimized, this approach can be used in control the nanoparticle movement and assemble these particles in actual nanomanufacturing system.
Simulation of Virtual Nanoparticle tracking using calculated forces for an Atomic Force Microscope and Optical TweezersView PDF of paper
ISBN:1-4200-6376-6
Pages:768
Hardcopy:$139.95
 
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